Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O
نویسندگان
چکیده
Industrial circuit designs commonly contain three-state elements, such as buses and drivers, transmission gates, and bidirectional I/O. A 5-valued fast fault simulation method and a 4-valued parallel pattern version that can handle these circuits are presented. Results demonstrate the effectiveness of the proposed methods in the presence of three-state elements, and show but a small performance degradation compared to 2or 3-valued fault simulation.
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